Vector network analyser

Organizational Unit

Grants related:


The modern VNA provides a complete electromagnetic analysis of a microwave circuit with one to many ports without the need to make multiple connections and disconnections. A complete quasi-simultaneous S parameter set can be provided for linear and non-linear systems.

This VNA, model PNA-X N5245A, is used during the microwave component development and testing from 0.01 to 50 GHz. Components as varied as Low Noise Amplifiers (LNA), polarisers and feedhorns can all be measured.

If it is combined with an acquisition system then system level tests can be carried out and even far field measurements on all kinds of antenna. This VNA is particularly specialized for LNA measurements and includes the most precise method of measuring noise figure to-date during the S-parameter measurement.

Related Technical facility
General view of the electronic design laboratory with several workbenches, electronic racks and cabinets for components and electronic parts
Electronic Design Laboratory

The laboratory has the necessary infrastructures for the development, integration and verification of electronic systems

Óscar Manuel
Tubio Araujo
Luis Fernando
Rodríguez Ramos
General view of the Electromagnetic Compatibility Laboratory with workbenches and computers and view in the background of the entrance to the shielded room
Electromagnetic Compatibility Laboratory

The laboratory is used for carrying out measurement and experiments in an environment completely isolated from external electromagnetic interferences.

Teodora Aleida
Viera Curbelo
Luis Fernando
Rodríguez Ramos
Related Capability
Image of an engineer working on the electronics of the adaptive optics system for GTC in the laboratory. Engineer sitting working on a computer with an open electronics cabinet at his side
Design, development and manufacture of electronic systems

Within its capacity of building scientific instrumentation, the IAC has extensive experience in the design and development of electronic systems in general and, especially, for astronomical instruments and devices